Obvladovanje kompleksnosti. Z rešitvami za mikroskopijo družbe ZEISS.
Naloge na področju materialne analize se nenehno spreminjajo, zahteve glede zmogljivosti pa se povečujejo. Komponente postajajo vse bolj zapletene, premazi pa vse tanjši. Miniaturizacija v elektroniki je vse bolj prisotna. Novi kompozitni materiali se uporabljajo zlasti v lahki konstrukciji. Trajnostni materiali in aditivno izdelane komponente predstavljajo poseben izziv pri določanju lastnosti materialov. Obenem se zmanjšujejo tudi tolerance napak, zato so potrebne natančnejše analize. Laboratoriji za preskušanje materialov morajo slediti temu razvoju. Zaradi tega pa so vse večjim časovnim pritiskom. Družba ZEISS ponuja strokovnjakom za materialno analizo edinstveno ponudbo mikroskopov, programske opreme in storitev za učinkovito opravljanje nalog preskušanja. Poleg tega rešitve družbe ZEISS za področje mikroskopije še posebej olajšajo delo vsem uporabnikom, saj so zaradi algoritmov globokega učenja rezultati zanesljivejši in hitrejši kot kdaj koli prej.
Brezhibna in učinkovita mikroskopija. Od vzorca do rezultata.
Pri materialni analizi so pomembni rezultati mikroskopiranja zagotovljeni le, če so bili brez napak izvedeni tudi predhodni procesni koraki. Družba ZEISS ponuja ustrezne mikroskope, s katerimi je celoten postopek analize zanesljiv in učinkovit: od odvzema in priprave vzorca do pridobivanja, obdelave in vrednotenja slik.
Kovinska površina pri 24-kratni povečavi
Slika polarizacijskega kontrasta za pregled procesa jedkanja
Slika kontrastnega temnega polja premaza Fosterit
Avtomatizirana segmentacija slik s programsko opremo ZEISS ZEN Core
Zajemanje 3D-slik kristalne strukture titana
Primeri mikroskopov
ZEISS Stemi 508
Stereomikroskop s povečavo 8:1 Ločljivost: 1 μm
ZEISS Axioscope 5
Delno motoriziran svetlobni mikroskop s kodiranimi elementi Ločljivost: 0,7 μm
ZEISS Axio Imager
Mikroskopski sistem za avtomatizirano analizo materialov Ločljivost: 250 nm
ZEISS EVO
Vrstični elektronski mikroskop za industrijsko analizo kakovosti Ločljivost: 2 nm
ZEISS Versa
Rentgenski mikroskop za neporušitveno zajemanje 3D-slik 3D-ločljivost: 40 nm
Če želite odpreti podatkovno okno z več podrobnostmi, kliknite na okrogle oznake na sliki.
Odlični program mikroskopije za laboratorij za materiale: svetlobna in digitalna mikroskopija
ZEISS Stemi 305/508
Pregled vzorca s stereomikroskopi ZEISS Stemi 305/508
ZEISS Axio Imager
Avtomatizirana analiza materiala s popolnoma motoriziranim mikroskopskim sistemom ZEISS Axio Imager
ZEISS Axio Zoom.V16
Velika vzorčna polja, topografija s stereomikroskopom s ZEISS Axio Zoom.V16
ZEISS Axiovert 5/7
Veliki in težki vzorci z invertiranim mikroskopom ZEISS Axiovert 5/7
ZEISS Axioscope
Rutinska opravila v laboratoriju za materiale z mikroskopom ZEISS Axioscope z odsevno svetlobo
ZEISS Smartzoom 5
Ponavljajoče se analize vzorcev in topografija z avtomatskim digitalnim mikroskopom ZEISS Smartzoom 5
Če želite odpreti podatkovno okno z več podrobnostmi, kliknite na okrogle oznake na sliki.
Odlični program mikroskopije za laboratorij za materiale: Vrstična elektronska in rentgenska mikroskopija
ZEISS CrystalCT
Neporušitveni rentgenski zajem 3D-slik z rentgenskim mikroskopom visoke ločljivosti ZEISS CrystalCT
ZEISS Sigma
Visokokakovostni zajem slik z vrstičnim elektronskim mikroskopom s poljsko emisijo ZEISS Sigma
ZEISS EVO
Modularna elektronska mikroskopija z vrstičnim elektronskim mikroskopom ZEISS EVO
ZEISS ZEN Core je standardizirana rešitev za zajem slik, segmentacijo, analizo in povezovanje podatkov v laboratoriju za materiale. Ker je mogoče uporabniški vmesnik konfigurirati glede na določeno nalogo, lahko s programsko opremo enostavno in varno upravljajo tudi neusposobljeni uporabniki. Programska oprema ZEN Core uporablja umetno inteligenco, ki v veliki meri avtomatizira ročno zahtevne delovne postopke, kot je segmentacija. Preprosta korelacija svetlobne, digitalne in elektronske mikroskopije omogoča globlje razumevanje mikrostrukture in analizo napak. S programsko opremo ZEISS ZEN Core lahko med seboj povežete več lokacij laboratorijev.
Vaše nadzorni center za vsa opravila.
Programska oprema ZEISS ZEN Core.
ZEISS ZEN Core
S programsko opremo ZEISS ZEN Core lahko med seboj povežete različne vrste mikroskopov in lokacije laboratorijev.
Hitrejše in zanesljivejše preskušanje z globokim učenjem
ZEISS ZEN Core omogoča avtomatizirano analizo slik za analizo delcev in faz. Tehnike globokega učenja znatno zmanjšajo delovno obremenitev teh aplikacij in vedno delujejo ponovljivo, po istih naučenih vzorcih, ne glede na uporabnika in lokacijo. Mikroskopska slika aluminijeve litine se avtomatizirano segmentira z uporabo globokega učenja. Algoritem zanesljivo prepozna posamezna zrna. Dotikajoče se in prekrivajoče se predmete je mogoče ločiti (segmentacija primerov).
Najnovejši modeli globokega učenja: Avtomatizirano določanje meja zrn keramike, avstenitnega jekla, trde kovine in litine na osnovi bakra s podporo umetne inteligence. V tem primeru je bilo dovolj, da smo usposobili model globokega učenja za zanesljivo prepoznavanje meja zrn vseh štirih materialov.
Korelacija s svetlobnimi, digitalnimi in elektronskimi mikroskopi
ZEISS ZEN Connect
Različni mikroskopi – ena korelirana ocena
Pri številnih aplikacijah je smiselno isti vzorec analizirati s svetlobnim in elektronskim mikroskopom. Različne stopnje povečave in kontrasti skupaj omogočajo boljše razumevanje stanja vzorca. S programsko opremo ZEISS ZEN Connect lahko učinkovito prekrijete večmodalne slikovne podatke in hitro preklopite s splošnega pogleda na podroben prikaz visoke ločljivosti. Vse slikovne podatke, vključno s podatki tretjih ponudnikov, je mogoče priročno poravnati, prekriti in prikazati v kontekstu s programsko opremo ZEISS ZEN Connect.
Kompleti orodij ZEISS ZEN Core
Programska oprema ZEISS ZEN Core ima modularno strukturo in jo je mogoče individualno razširiti z orodji, ki jih potrebujete.
Družba ZEISS med drugim ponuja te dodatne komplete orodij:
Aplikacije za materiale Orodja za analize velikosti zrn, analize litine, večfazne analize, primerjave referenčnih serij in meritve debeline premazov
Komplet orodij na podlagi umetne inteligence Komplet aplikacij na podlagi umetne inteligence za segmentacijo, klasifikacijo objektov in odpravljanje šumov v slikah, vključno z vmesniki za usposabljanje
Nabor orodij za analizo 2D-slik Analiza 2D-slik z uporabo programov za avtomatsko merjenje, vključno z napredno obdelavo
Komplet orodij za razvijalce Programiranje prilagojenih makrov v programskem jeziku Python, nadzor ZEISS ZEN Core prek vmesnika API
Shranjevanje podatkov Osrednja slikovna zbirka podatkov na osnovi SQL za inteligentno upravljanje podatkov z integriranim uporabniškim upravljanjem dostopom
Nabor orodij za programsko opremo Connect ZEISS ZEN Connect vam omogoča poravnavo, prekrivanje in korelacijo multimodalnih slikovnih podatkov iz različnih vrst mikroskopov.
Določanje lastnosti materialov s programsko opremo ZEISS ZEN Core
Enostavno vrednotenje v skladu s standardi
Tehnična keramika, medicinska tehnologija
CFRP, letalska in vesoljska industrija
Sončne celice, obnovljivi viri energije
Siva litina, sistemski inženiring
Jeklo, sistemski inženiring
Vrste uporabe
Velikost zrn Porazdelitev velikosti zrn
Večfaznost Fazni delež v odstotkih po površini
Debelina plasti Avtomatizirano zaznavanje robov
Lito železo Velikost, oblika in porazdelitev litih delcev
NMI Količina in velikost oksidov, sulfidov, nitridov itd
Razlaga
Kvantitativno določite kristalografsko strukturo vaših materialov v skladu z mednarodnimi standardi.
S tem modulom lahko določite faze glede na velikost delcev in glede na odstotek ustrezne površine faze. Pomembna vrsta uporabe je pregled poroznosti.
Izmerite debelino premazov in prevlek ali globino utrjenih površin v prečnem prerezu vzorca. Samodejno ali interaktivno ocenjujte kompleksne sisteme premazov in rezultate prikažite v preglednem poročilu.
Popolnoma avtomatizirano analizirajte obliko in velikost grafitnih delcev v litem železu ter določite odstotek grafitnih delcev po površini.
S tem modulom lahko preverite nekovinske vključke v jeklu in ocenite čistost jekla. S standardni skladna avtomatizirana rešitev delovnega postopka vključuje zbiranje vzorcev, razvrščanje in vrednotenje vključkov ter dokumentiranje in arhiviranje rezultatov.
Primer tehnologije akumulatorjev:
Analiza velikosti zrn katodnih delcev NCM
Z elektronskim mikroskopom ZEISS z detektorjem Inlense-EsB je mogoče razkriti manj vidne meje zrn katodnih delcev NCM. Algoritem umetne inteligence nato samodejno in zanesljivo segmentira mikroskopsko sliko. Tako analizirano sliko lahko na primer uporabite za določitev porazdelitve velikosti zrn.
Primer: Večfazna analiza
termično brizganega premaza
Termično brizgani premazi med drugim izboljšajo odpornost materiala podlage proti koroziji, vročini ali obrabi. Poroznost metalografsko pripravljenega vzorca je mogoče enostavno določiti z večfazno analizo, podprto z umetno inteligenco. S podatki o poroznosti je mogoče določiti strukturo in trdoto brizganega premaza.
To ne bi moglo biti'enostavnejše; in ne glede na to, kdo bi ta vzorec pregledal, bi bili rezultati meritev vedno enaki.
Preberite več o naših rešitvah ZEISS za materialno analizo
Bolj inteligentno. Večji prihranek časa. ZEISS ZEN Intellesis.
Metalografija in preizkušanje materialov z moduli za materiale ZEISS ZEN Core.
Zagotovljena kakovost pri proizvodnji jekla: Analiza nekovinskih vključkov (NMI) družbe ZEISS
ZEISS ZEN Connect: Mikroskopske slike in analitični podatki v splošnem kontekstu.
ZEISS ZEN Data Storage: Centralizirano upravljanje podatkov v omreženih laboratorijskih okoljih.
Vsebina tretjih oseb je blokirana
Video predvajalnik je blokiran zaradi vaših nastavitev piškotkov. Če želite spremeniti nastavitve in predvajati videoposnetek, kliknite spodnji gumb in se strinjajte z uporabo »funkcionalnih« tehnologij sledenja.
Umetna inteligenca pospeši postopek merjenja Rešitev ZEISS, podprta z umetno inteligenco, samodejno preverja prevleke vsadkov.
Umetna inteligenca pospešuje postopek merjenja
Vsebina tretjih oseb je blokirana
Video predvajalnik je blokiran zaradi vaših nastavitev piškotkov. Če želite spremeniti nastavitve in predvajati videoposnetek, kliknite spodnji gumb in se strinjajte z uporabo »funkcionalnih« tehnologij sledenja.
Družba SPC Werkstofflabor GmbH podpira proizvajalce in obdelovalce jekla kot storitveni partner – z uporabo kombinacije svetlobne in vrstične elektronske mikroskopije družbe ZEISS
Nadzor je boljši: SPC pregleduje materiale z rešitvami ZEISS za mikroskopijo
Vsebina tretjih oseb je blokirana
Video predvajalnik je blokiran zaradi vaših nastavitev piškotkov. Če želite spremeniti nastavitve in predvajati videoposnetek, kliknite spodnji gumb in se strinjajte z uporabo »funkcionalnih« tehnologij sledenja.
Z uporabo preizkušenih tehnik strojnega učenja, kot sta klasifikacija svetlobnih pik ali globoko učenje, ZEISS ZEN Intellesis omogoča, da tudi nestrokovnjaki dosežejo zanesljive in ponovljive rezultate segmentacije. Preprosto naložite sliko, določite razrede, označite svetlobne pike, usposobite model in izvedite segmentacijo.
Bolj inteligentno. Večji prihranek časa. ZEISS ZEN Intellesis.
Vsebina tretjih oseb je blokirana
Video predvajalnik je blokiran zaradi vaših nastavitev piškotkov. Če želite spremeniti nastavitve in predvajati videoposnetek, kliknite spodnji gumb in se strinjajte z uporabo »funkcionalnih« tehnologij sledenja.
Kako pospešiti metalografske preiskave? Kako obdelati nove materiale? Kako se izogniti nepravilnim rezultatom? Kako zagotoviti produktivnost v laboratoriju? Z ZEN Core ne pridobivate le funkcij, temveč dobite pravi paket za produktivnost in preiskave materiala dvignete na višjo raven
Metalografija in preizkušanje materialov z moduli za materiale ZEISS ZEN Core.
Vsebina tretjih oseb je blokirana
Video predvajalnik je blokiran zaradi vaših nastavitev piškotkov. Če želite spremeniti nastavitve in predvajati videoposnetek, kliknite spodnji gumb in se strinjajte z uporabo »funkcionalnih« tehnologij sledenja.
Jeklo je eden najpogosteje uporabljenih materialov na svetu. Kljub majhnosti lahko nekovinski vključki vplivajo na mehanske lastnosti ter na obdelavo in korozijsko obnašanje jekla. ZEN Non-Metallic Inclusions je vaša rešitev za hitro in zanesljivo analizo nekovinskih vključkov.
Zagotovljena kakovost pri proizvodnji jekla: Analiza nekovinskih vključkov (NMI) družbe ZEISS
Vsebina tretjih oseb je blokirana
Video predvajalnik je blokiran zaradi vaših nastavitev piškotkov. Če želite spremeniti nastavitve in predvajati videoposnetek, kliknite spodnji gumb in se strinjajte z uporabo »funkcionalnih« tehnologij sledenja.
Z ZEN Connect lahko vizualizirate različne mikroskopske slike in podatke vzorca – v njihovem kontekstu na skupnem mestu. Odkrijte povezave med slikovnimi podatki različnih ravni. Prav tako lahko izkoristite integrirano poročanje o povezanih podatkovnih nizih.
ZEISS ZEN Connect: Mikroskopske slike in analitični podatki v splošnem kontekstu.
Vsebina tretjih oseb je blokirana
Video predvajalnik je blokiran zaradi vaših nastavitev piškotkov. Če želite spremeniti nastavitve in predvajati videoposnetek, kliknite spodnji gumb in se strinjajte z uporabo »funkcionalnih« tehnologij sledenja.
ZEN Data Storage omogoča centralizirano upravljanje prednastavitev naprav, delovnih postopkov, slikovnih podatkov in poročil iz različnih sistemov in laboratorijskih lokacij. Ločite pridobivanje mikroskopskih slik od nadaljnjih analiz, da bo laboratorijsko delo še bolj učinkovito.
ZEISS ZEN Data Storage: Centralizirano upravljanje podatkov v omreženih laboratorijskih okoljih.
Natančni in zanesljivi rezultati so seveda pomembni, prav tako pa je pomembno, da jih dobite hitro.
Uporaba mikroskopije za področje materialne analize:
Primeri strank iz industrije za industrijo
Ne bi moglo biti preprostejše.
Rešitev ZEISS, podprta z umetno inteligenco, samodejno preverja prevleke vsadkov.
Inovativne rešitve na področju e-mobilnosti.
Električni pogonski sistemi: GROB in ZEISS zagotavljata učinkovito proizvodnjo brez napak.
Kombinirana mikroskopija ZEISS za preizkušanje materialov
Kombinacija svetlobne in vrstične elektronske mikroskopije ZEISS prepriča.
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![Stéphane Monod]({"xsmall":"https://www.zeiss.si/content/dam/iqs/r/systems/industrial-microscopy/materialography/smith-nephew_zeiss_6906_b.jpg/_jcr_content/renditions/original.image_file.100.100.file/smith-nephew_zeiss_6906_b.jpg","small":"https://www.zeiss.si/content/dam/iqs/r/systems/industrial-microscopy/materialography/smith-nephew_zeiss_6906_b.jpg/_jcr_content/renditions/original.image_file.360.360.file/smith-nephew_zeiss_6906_b.jpg","medium":"https://www.zeiss.si/content/dam/iqs/r/systems/industrial-microscopy/materialography/smith-nephew_zeiss_6906_b.jpg/_jcr_content/renditions/original.image_file.768.768.file/smith-nephew_zeiss_6906_b.jpg","large":"https://www.zeiss.si/content/dam/iqs/r/systems/industrial-microscopy/materialography/smith-nephew_zeiss_6906_b.jpg/_jcr_content/renditions/original./smith-nephew_zeiss_6906_b.jpg","xlarge":"https://www.zeiss.si/content/dam/iqs/r/systems/industrial-microscopy/materialography/smith-nephew_zeiss_6906_b.jpg/_jcr_content/renditions/original./smith-nephew_zeiss_6906_b.jpg","xxlarge":"https://www.zeiss.si/content/dam/iqs/r/systems/industrial-microscopy/materialography/smith-nephew_zeiss_6906_b.jpg/_jcr_content/renditions/original./smith-nephew_zeiss_6906_b.jpg","max":"https://www.zeiss.si/content/dam/iqs/r/systems/industrial-microscopy/materialography/smith-nephew_zeiss_6906_b.jpg/_jcr_content/renditions/original./smith-nephew_zeiss_6906_b.jpg"} "Stéphane Monod")
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