![Taktilna tipala]({"xsmall":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.100.33.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","small":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.360.120.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","medium":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.768.256.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","large":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.1024.341.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","xlarge":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.1274.425.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","xxlarge":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.1274.425.0,139,1274,564.file/tactile-probes-stage-desktop.jpg","max":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/tactile-probes-stage-desktop.jpg/_jcr_content/renditions/original.image_file.1274.425.0,139,1274,564.file/tactile-probes-stage-desktop.jpg"} "Taktilna tipala")
Taktilna tipala
Za visoko natančnost in različne merilne naloge
Taktilne merilne glave na KMS
Taktilna tipala so prava izbira, kadar je potrebna zelo visoka stopnja natančnosti. Pri tehnologiji taktilnega merjenja se površina komponente meri po točkah ali pa se, odvisno od tipala, skenira z veliko hitrostjo. ZEISS ponuja široko paleto taktilnih tipal, ki zagotavljajo pravo rešitev za vašo aplikacijo.
Enotočkovno merjenje v primerjavi s tehnologijo skeniranja ZEISS
Skeniranje omogoča hitrejše in natančnejše meritve, saj se v krajšem času izmeri več točk kot pri enotočkovnem merjenju.
Enotočkovno merjenje
Pri merjenju z enotočkovnimi tipali se merijo le posamezne točke. Nato je treba tipalo premakniti in postopek ponoviti. Razmere med merilnimi točkami se izračunajo z interpolacijo, kar lahko povzroči odstopanja pri meritvah. Merjenje z enotočkovnimi tipali je primerno za majhno proizvodnjo in velika odstopanja. Možna je kombinacija s sistemom ZEISS RDS.
Tehnologija skeniranja
Med skeniranjem se tipalo premika gladko in neprekinjeno ter v zelo kratkem času izmeri na stotine točk vzdolž poti, ko se tipalo premika po površini. Ta potek dela ne zagotavlja le bistveno več podatkov z večjo zmogljivostjo, temveč omogoča tudi velik prihranek časa.
Tipala za skeniranje so primerna za visoke stopnje pretoka z odlično stopnjo natančnosti.
![Enotočkovno merjenje]({"xsmall":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.100.75.14,0,946,699.file/touch-trigger.jpg","small":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.360.270.14,0,946,699.file/touch-trigger.jpg","medium":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.768.576.14,0,946,699.file/touch-trigger.jpg","large":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/touch-trigger.jpg","xlarge":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/touch-trigger.jpg","xxlarge":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/touch-trigger.jpg","max":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/touch-trigger.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/touch-trigger.jpg"} "Enotočkovno merjenje")
![Tehnologija skeniranja]({"xsmall":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.100.75.14,0,946,699.file/scanning.jpg","small":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.360.270.14,0,946,699.file/scanning.jpg","medium":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.768.576.14,0,946,699.file/scanning.jpg","large":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/scanning.jpg","xlarge":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/scanning.jpg","xxlarge":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/scanning.jpg","max":"https://www.zeiss.si/content/dam/iqs/r/systems/cmm/probes-and-sensors/tactile-probes/images/scanning.jpg/_jcr_content/renditions/original.image_file.932.699.14,0,946,699.file/scanning.jpg"} "Tehnologija skeniranja")
Prednosti integriranega delovnega postopka skeniranja
Medtem ko so razmerja med posameznimi točkami pri enotočkovnem merjenju določena z interpolacijo, lahko tehnologija skeniranja zajame bistveno več podatkov ter doseže večjo zanesljivost in natančnost meritev. Visoka hitrost skeniranja omogoča večjo pretočnost meritev in preverjanje odstopanj pri čim večjem številu delov. Hitrejše skeniranje pomeni tudi, da je potrebnih manj koordinatnih merilnih strojev, težave pa se hitreje odkrijejo, kar zmanjšuje izmet in predelavo obdelovancev.